Publications
- Quantitative evaluation of process-induced line-edge roughness in FinFET: Bayesian regression model
- Recent Studies on Supercapacitors with Next-Generation Structures
- Effects of Interface Trap on Transient Negative Capacitance Effect: Phase Field Model
- Trade-off between interfacial charge and negative capacitance effects in the Hf-Zr-Al-O/Hf0.5Zr0.5O2 bilayer system
- Impact of depolarization electric-field and charge trapping on the coercive voltage of an Si:HfO2-based ferroelectric capacitor
