Publications
- Study of random dopant fluctuation in PNPN feedback FET
- Time-resolved electrical characteristics of ferroelectric-gated fully depleted silicon on insulator devices
- Device design guideline for junctionless gate-all-around nanowire negative-capacitance FET with HfO2-based ferroelectric gate stack
- Study of Line Edge Roughness on Various Types of Gate-All-Around Field Effect Transistor
- Study of work-function variation in stacked multiple-channel-structure device
