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Investigation of Interface Trap Density by Low Frequency Noise and Subthreshold Slope

윤찬근 2020.04.19 16:05 조회 수 : 63

 

저자

Seungjoon Moon and Changhwan Shin

학술대회명

The 27th Korean Conference on Semiconductors

학회논문

Investigation of Interface Trap Density by Low Frequency Noise and Subthreshold Slope

발표유형

포스터 발표

개최국

대한민국

발표년월

2020-02

 

이 게시물을

반도체 소자 및 회로 연구실 홈페이지 관리자 박현정입니다.

 

홈페이지 관련 문의는 제 이메일 (hyun7256@g.skku.edu) 으로 보내주시면 됩니다.

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